Milestone for Nanoelectronics

In collaboration with the University of Regensburg, Germany, and Utrecht University, Netherlands, IBM scientists demonstrated the ability to measure the charge state of individual atoms using noncontact atomic force microscopy. They imaged and identified differently charged individual gold and silver atoms by measuring the tiny differences in the forces between the tip of an atomic force microscope and a charged or uncharged atom located in close proximity below it. This opens up new possibilities in the exploration of nanoscale structures and devices at the ultimate atomic and molecular limits. These results hold potential to impact a variety of fields such as molecular electronics, catalysis or photovoltaics.
www.ibm.com/us/en/

Advertisements

Kommentar verfassen

Trage deine Daten unten ein oder klicke ein Icon um dich einzuloggen:

WordPress.com-Logo

Du kommentierst mit Deinem WordPress.com-Konto. Abmelden /  Ändern )

Google+ Foto

Du kommentierst mit Deinem Google+-Konto. Abmelden /  Ändern )

Twitter-Bild

Du kommentierst mit Deinem Twitter-Konto. Abmelden /  Ändern )

Facebook-Foto

Du kommentierst mit Deinem Facebook-Konto. Abmelden /  Ändern )

w

Verbinde mit %s

%d Bloggern gefällt das: