FEI Joins Metrology Research at University of Albany

Juli 15, 2009

FEI Company, a provider of atomic-scale imaging and analysis systems, and Sematech, the global consortium of chipmakers, announced that FEI has joined Sematech’s Advanced Metrology Development Program at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany, US. As a member of this program, FEI will collaborate with experts to develop high-resolution capabilities of transmission electron microscopy (TEM) analysis, with electron energy loss spectroscopy (EELS) and focused ion beam (FIB) technology to address critical needs in process development and defect analysis.
www.fei.com
www.cnse.albany.edu
www.sematech.org


First Taiwan AFM Bioworkshop

Juni 30, 2009

Asylum Research, in conjunction with the National Health Research Institutes (NHRI), will host the first Taiwan AFM Bioworkshop to be held July 30-31, 2009 at NHRI, Zhunan Campus, in Taiwan. The workshop will combine talks from leading researchers and industry experts on atomic force microscopy for life science applications, as well as instructional AFM demonstrations. Topics covered include principles of AFM, biological imaging, force spectroscopy, integration of AFM and optical microscopy, sample preparation, application examples and future directions in AFM. The event is free to all researchers in the field of AFM.
www.asylumresearch.com/bioworkshop


Euro Atomic Force Microscopy Forum

April 27, 2009

Asylum Research, in conjunction with IMETUM, Nano Initiative Munich, and Atomic Force F&E, announces the 2nd Euro AFM Forum to be held at the Technical University of Munich (TUM), Garching, Germany, July 1-3, 2009. The event is a conference for AFM researchers to share their cutting-edge research for both materials and life science applications. The forum will combine invited and contributed talks from leading European researchers as well as instructional workshops on AFM equipment. Workshop topics include cell imaging, imaging in liquids, force spectroscopy, electrical characterization and more.
Participants are invited to submit their best AFM image for the Forum Image Contest. An iPod Nano will be awarded for the best image that represents innovative science and has the „cool“ factor. The deadline for submission is June 1, 2009.
www.atomicforce.de/Euro-AFM-Forum-2009.php

Surface of a Chestnut. DC mode in air. Taken by Thomas Gutsmann, Research Center Borstel, Germany

Surface of a Chestnut, DC mode in air. Taken by Thomas Gutsmann, Research Center Borstel, Germany (participant of the 2007 event).


International Nanoscience Conference

Februar 16, 2009

Veeco Instruments has announced it will host the seventh „Seeing at the Nanoscale“ conference at the University of California, Santa Barbara (UCSB), July 28-31, 2009. The conference provides a forum for academic and industrial scientists to share information and exchange ideas on advanced nanotechnology topics, ranging from novel imaging approaches and unique material characterization to combining atomic force microscopy (AFM) with other technologies, such as confocal microscopy and raman spectroscopy. This year there is also a special session on emerging AFM markets, such as energy generation, storage and conservation.
www.veeco.com/nanoconference
www.ucsb.edu