Aspects of Electron Microscopy and Microanalysis

August 11, 2009

Senior Metallurgical Engineer and Engineering Manager Dr. John Tartaglia of Stork Climax Research Services will be presenting a seminar titled „Aspects of Electron Microscopy and Microanalysis,“ on August 21, 2009 at Stork CRS in Wixom, Michigan, US.  The seminar will be offered in either a morning (9:00 AM to 12:00 PM) or afternoon (1:30 PM to 4:30 PM) session. Both sessions will be followed by optional tours of the laboratory facilities. There is no cost to attend this presentation. For reservations see:
www.storksmt.com


Canada Gains New Centre for Nanotechnology

Juli 20, 2009

Alberta, Canada will soon be home to a new research and product development centre for nanotechnology called Hitachi Electron Microscopy Products Development Centre (HEMiC) at the National Institute for Nanotechnology (NINT) in Edmonton. The centre will house three new electron microscopes valued at $7 million. The $14 million project is supported by the Western Economic Partnership Agreement between the Governments of Canada and Alberta and to contributions from Hitachi High-Technologies. The HEMiC is made possible by a wider collaboration of the Alberta Ingenuity Fund’s nanoWorks program, the National Institute for Nanotechnology of the National Research Council, the University of Alberta and Hitachi High Technologies Canada Inc. One of the centre’s first projects will evaluate and test the world’s sharpest electron emitter, developed by the Molecular Scale Devices group at NINT for use as an electron source in electron microscopes.
www.nrc-cnrc.gc.ca


Interdisciplinary Symposium on 3D Microscopy

Juni 3, 2009

3D Microscopy, taking place from July 12 -16, 2009 in Interlaken, Switzerland, is an international symposium focused on 3D imaging and spectroscopy in science. The objective of this symposium is to create a forum for researchers with different expertise and scientific interests to present their knowhow and the techniques they use to answer their scientific questions. Methods using three-dimensional imaging and spectroscopy to retrieve data in volume will be discussed, whether “light”, x-rays, electrons or near field probes are used. The conference contains 3 plenary talks and 9 sessions with invited and contributed talks and poster sessions.

Session topics are:

– High resolution TEM and AFM
– 3D CLSM and light microscopy
– Stereology
– 3D TEM and atom probe tomography/serial sectioning
– 3D correlative microscopy
– 3D X-ray microscopy and tomography
– 3D FIB/SEM or serial sectioning (with Denk-method) blockface tomography
– 3D image analysis and simulation
– 3D scanning probe microscopy

www.ssom.ch/3D/index.html

Interlaken, Switzerland

Interlaken, Switzerland


Frontiers of Electron Microscopy in Materials Sciences

Mai 25, 2009

The Twelfth Frontiers of Electron Microscopy in Materials Science, FEMMS2009, will take place from Sept. 27 – Oct. 2, 2009 at “Huis Ten Bosch” in Sasebo/Nagasaki in Kyushu Island, Japan. FEMMS is an international a biennial symposium series focused on the application of electron microscopy, primarily TEM, in the field of materials science. The conference contains a plenary talk, 9 sessions of invited talks and poster sessions of contributed papers. The sessions cover recent progresses and emerging trends, such as current instrument advances in TEM, SEM, HVEM and detecting systems, ultra-high resolution imaging and analysis, in-situ and ultra-fast analysis, 3-dimensional analysis, and so on. Dr. Akira Tonomura, a world renowned pioneer in the field of electron holography, will give a plenary talk as the distinguished lectureship award winner.
www.femms2009.org

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