Frontiers of Electron Microscopy in Materials Sciences

Mai 25, 2009

The Twelfth Frontiers of Electron Microscopy in Materials Science, FEMMS2009, will take place from Sept. 27 – Oct. 2, 2009 at “Huis Ten Bosch” in Sasebo/Nagasaki in Kyushu Island, Japan. FEMMS is an international a biennial symposium series focused on the application of electron microscopy, primarily TEM, in the field of materials science. The conference contains a plenary talk, 9 sessions of invited talks and poster sessions of contributed papers. The sessions cover recent progresses and emerging trends, such as current instrument advances in TEM, SEM, HVEM and detecting systems, ultra-high resolution imaging and analysis, in-situ and ultra-fast analysis, 3-dimensional analysis, and so on. Dr. Akira Tonomura, a world renowned pioneer in the field of electron holography, will give a plenary talk as the distinguished lectureship award winner.
www.femms2009.org

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Microscopy and Microanalysis Conference

Mai 18, 2009

The Microscopy & Microanalysis 2009 Conference, which is the annual meeting of the Microscopy Society of America and the Microbeam Analysis Society, will take place from July 26-30, 2009 in Richmond, Virginia, US. This year’s conference is co-sponsored by the International Metallographic Society. The event addresses to scientists, technologists and students who use microscopy or microanalysis in their research. Topics of the full-day short courses include electron tomography, digital imaging, FIB methodologies, variable pressure and environmental SEM imaging and analysis, cryo EM and interpretation of metallographic microstructures. Over 30 symposia focus on applications in both the biological and physical sciences as well as recent and emerging trends in instrumentation and techniques. Further, contributed sessions, tutorial sessions, poster presentations as well as round-table discussions will be held. www.internationalmetallographicsociety.org
http://mm2009.microscopy.org