Interdisciplinary Symposium on 3D Microscopy

Juni 3, 2009

3D Microscopy, taking place from July 12 -16, 2009 in Interlaken, Switzerland, is an international symposium focused on 3D imaging and spectroscopy in science. The objective of this symposium is to create a forum for researchers with different expertise and scientific interests to present their knowhow and the techniques they use to answer their scientific questions. Methods using three-dimensional imaging and spectroscopy to retrieve data in volume will be discussed, whether “light”, x-rays, electrons or near field probes are used. The conference contains 3 plenary talks and 9 sessions with invited and contributed talks and poster sessions.

Session topics are:

– High resolution TEM and AFM
– 3D CLSM and light microscopy
– Stereology
– 3D TEM and atom probe tomography/serial sectioning
– 3D correlative microscopy
– 3D X-ray microscopy and tomography
– 3D FIB/SEM or serial sectioning (with Denk-method) blockface tomography
– 3D image analysis and simulation
– 3D scanning probe microscopy

Interlaken, Switzerland

Interlaken, Switzerland

Euro Atomic Force Microscopy Forum

April 27, 2009

Asylum Research, in conjunction with IMETUM, Nano Initiative Munich, and Atomic Force F&E, announces the 2nd Euro AFM Forum to be held at the Technical University of Munich (TUM), Garching, Germany, July 1-3, 2009. The event is a conference for AFM researchers to share their cutting-edge research for both materials and life science applications. The forum will combine invited and contributed talks from leading European researchers as well as instructional workshops on AFM equipment. Workshop topics include cell imaging, imaging in liquids, force spectroscopy, electrical characterization and more.
Participants are invited to submit their best AFM image for the Forum Image Contest. An iPod Nano will be awarded for the best image that represents innovative science and has the „cool“ factor. The deadline for submission is June 1, 2009.

Surface of a Chestnut. DC mode in air. Taken by Thomas Gutsmann, Research Center Borstel, Germany

Surface of a Chestnut, DC mode in air. Taken by Thomas Gutsmann, Research Center Borstel, Germany (participant of the 2007 event).

International Nanoscience Conference

Februar 16, 2009

Veeco Instruments has announced it will host the seventh „Seeing at the Nanoscale“ conference at the University of California, Santa Barbara (UCSB), July 28-31, 2009. The conference provides a forum for academic and industrial scientists to share information and exchange ideas on advanced nanotechnology topics, ranging from novel imaging approaches and unique material characterization to combining atomic force microscopy (AFM) with other technologies, such as confocal microscopy and raman spectroscopy. This year there is also a special session on emerging AFM markets, such as energy generation, storage and conservation.

WITec Academy Established

Februar 6, 2009

WITec, a manufacturer of high-resolution optical and scanning probe microscopy solutions, has established the WITec Academy as a new forum for advanced instrument and software operation training. It offers basic and expert level courses covering the entire range of WITec products. Experienced and new users are offered a graded course structure with seminars and hands-on training sessions. The full day courses are held frequently throughout the year. Participants will receive training materials and a certificate of attendance.