Fellow for the Microscopy Society of America

Juli 23, 2009

Harald Rose, professor of Physics at the Technical University of Darmstadt, Germany has been elected a Fellow for the Microscopy Society of America (MSA). Rose is a pioneer in electron microscopy: Together with his colleagues Maximillian Haider and Knut Urban he was the first to make single atoms visible by using electron microscopy. The designation of “MSA Fellow” is intended to recognize senior members of the society who have made significant contributions to the advancement of the science and practice of microscopy imaging, analysis and/or diffraction techniques. The fellowship certificate will be presented to him during the Microscopy and Microanalysis 2009 meeting in Richmond, VA, US.
www.microscopy.org
www.tu-darmstadt.de

Harald Rose, Professor of Physiscs at TU Darmstadt, Germany (source: www.idw-online.de)

Harald Rose, Professor of Physiscs at TU Darmstadt, Germany (source: http://www.idw-online.de)

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Fellow for the Microscopy Society of America

Juni 26, 2009

Yimei Zhu, a scientist at the U.S. Department of Energy’s Brookhaven National Laboratory, has been elected the inaugural Fellow of the Microscopy Society of America, an affiliate of the American Institute of Physics and the American Association for the Advancement of Science. Limited to a small fraction of members, the designation of Fellow recognizes senior distinguished members of the society who have made significant contributions to the advancement of the science and practice of microscopy. Zhu will formally be awarded the society’s first fellowship at its annual meeting in Richmond, Virginia, US, to be held in July. His citation reads: “For outstanding and innovative development and implementation of advanced electron microscopy techniques including quantitative diffraction, imaging, spectroscopy, and phase retrieval methods in understanding superconducting, ferromagnetic, and strongly correlated materials.”
www.bnl.gov

Yimei Zhu, inaugural fellow of the Microscopy Society of America

Yimei Zhu, inaugural fellow of the Microscopy Society of America (photo: Courtesy of Brookhaven National Laboratory)


Microscopy and Microanalysis Conference

Mai 18, 2009

The Microscopy & Microanalysis 2009 Conference, which is the annual meeting of the Microscopy Society of America and the Microbeam Analysis Society, will take place from July 26-30, 2009 in Richmond, Virginia, US. This year’s conference is co-sponsored by the International Metallographic Society. The event addresses to scientists, technologists and students who use microscopy or microanalysis in their research. Topics of the full-day short courses include electron tomography, digital imaging, FIB methodologies, variable pressure and environmental SEM imaging and analysis, cryo EM and interpretation of metallographic microstructures. Over 30 symposia focus on applications in both the biological and physical sciences as well as recent and emerging trends in instrumentation and techniques. Further, contributed sessions, tutorial sessions, poster presentations as well as round-table discussions will be held. www.internationalmetallographicsociety.org
http://mm2009.microscopy.org