August 14, 2009
The 11th International Conference on Methods and Applications of Fluorescence: Spectroscopy, Imaging and Probes will be held in Budapest, Hungary, from September 6-9, 2009. The venue of the Conference is the Congress Center of the oldest Hungarian University, the Eötvös Loránd University.
The meeting will cover the following scientific topics:
– Fluorescence Spectroscopy (Theory and Applications)
– Fluorescence Correlation and Single Molecule Spectroscopy
– Fluorescence in Biology/Medicine: Bioassays, Biophysics
– Special Fluorescent Imaging Techniques: Multi-Photon, Live Cell and Single Molecule Imaging
– Novel Fluorescent Probes, Sensors, Fluorescent Proteins, Quantum Dots, Nanomaterials and their Applications
– Special Fluorescence Techniques: Upconversion, Delayed Fluorescence, Fast Fluorescence Kinetics FRET, etc.
– Fluorescence Microscopy: Towards Higher Spatial and Temporal Resolution
– Fluorescence in Systems Biology High Throughput Screening Assays, Arrays, Micro-chip
Juli 29, 2009
Thermo Fisher Scientific will hold its 2009 Spectroscopy User Meeting from September 14-15, 2009 in Stratford, UK. The event will cover an evening applications workshop on September, 14 and a free of charge scientific programme on September, 15. The scientific programme will feature talks from spectroscopy instrument users. In addition applications specialists will be providing an update on recent advances in the use of infra-red, near infra-red, Raman and UV spectroscopy. There will also be the opportunity to see current generation spectroscopy systems in operation and see how sample handling and data analysis tools have changed over the years.
Juli 15, 2009
FEI Company, a provider of atomic-scale imaging and analysis systems, and Sematech, the global consortium of chipmakers, announced that FEI has joined Sematech’s Advanced Metrology Development Program at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany, US. As a member of this program, FEI will collaborate with experts to develop high-resolution capabilities of transmission electron microscopy (TEM) analysis, with electron energy loss spectroscopy (EELS) and focused ion beam (FIB) technology to address critical needs in process development and defect analysis.
Juni 30, 2009
Asylum Research, in conjunction with the National Health Research Institutes (NHRI), will host the first Taiwan AFM Bioworkshop to be held July 30-31, 2009 at NHRI, Zhunan Campus, in Taiwan. The workshop will combine talks from leading researchers and industry experts on atomic force microscopy for life science applications, as well as instructional AFM demonstrations. Topics covered include principles of AFM, biological imaging, force spectroscopy, integration of AFM and optical microscopy, sample preparation, application examples and future directions in AFM. The event is free to all researchers in the field of AFM.
Juni 26, 2009
Yimei Zhu, a scientist at the U.S. Department of Energy’s Brookhaven National Laboratory, has been elected the inaugural Fellow of the Microscopy Society of America, an affiliate of the American Institute of Physics and the American Association for the Advancement of Science. Limited to a small fraction of members, the designation of Fellow recognizes senior distinguished members of the society who have made significant contributions to the advancement of the science and practice of microscopy. Zhu will formally be awarded the society’s first fellowship at its annual meeting in Richmond, Virginia, US, to be held in July. His citation reads: “For outstanding and innovative development and implementation of advanced electron microscopy techniques including quantitative diffraction, imaging, spectroscopy, and phase retrieval methods in understanding superconducting, ferromagnetic, and strongly correlated materials.”
Yimei Zhu, inaugural fellow of the Microscopy Society of America (photo: Courtesy of Brookhaven National Laboratory)
Juni 24, 2009
The Fluorescence Education Center, also referred to as the Fluorescence Foundation, will host two courses on the principles of fluorescence techniques to be held from:
June 29 – July 2, 2009 in Genova, Italy
September 14-17, 2009 in Madrid, Spain
The Principles of Fluorescence Techniques course will outline the basic concepts of fluorescence techniques and the successful utilization of the currently available commercial instrumentation. The course is designed for students who utilize fluorescence techniques and instrumentation and for researchers and industrial scientists who wish to deepen their knowledge of fluorescence applications. Key scientists in the field will deliver theoretical lectures. The lectures will be complemented by the direct utilization of steady state and lifetime fluorescence instrumentation and confocal microscopy for FLIM and FRET applications.
Topics addressed in this course include:
– Basic Definitions and Principles of Fluorescence
– Fluorescence Polarization
– Time-resolved Fluorescence
– Data Manipulation and Data Analysis
– Non-Linear Microscopy Including SHG
– GFP Fluorescence and Photoactivation
– Confocal and Multiphoton Fluorescence Microscopy
– FCS, Fluorescence Correlation Spectroscopy
– FLIM, Fluorescence Lifetime Imaging
– Single Molecule Imaging
– Image Processing and Deconvolution Approaches
Juni 3, 2009
3D Microscopy, taking place from July 12 -16, 2009 in Interlaken, Switzerland, is an international symposium focused on 3D imaging and spectroscopy in science. The objective of this symposium is to create a forum for researchers with different expertise and scientific interests to present their knowhow and the techniques they use to answer their scientific questions. Methods using three-dimensional imaging and spectroscopy to retrieve data in volume will be discussed, whether “light”, x-rays, electrons or near field probes are used. The conference contains 3 plenary talks and 9 sessions with invited and contributed talks and poster sessions.
Session topics are:
– High resolution TEM and AFM
– 3D CLSM and light microscopy
– 3D TEM and atom probe tomography/serial sectioning
– 3D correlative microscopy
– 3D X-ray microscopy and tomography
– 3D FIB/SEM or serial sectioning (with Denk-method) blockface tomography
– 3D image analysis and simulation
– 3D scanning probe microscopy