FEI Joins Metrology Research at University of Albany

FEI Company, a provider of atomic-scale imaging and analysis systems, and Sematech, the global consortium of chipmakers, announced that FEI has joined Sematech’s Advanced Metrology Development Program at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany, US. As a member of this program, FEI will collaborate with experts to develop high-resolution capabilities of transmission electron microscopy (TEM) analysis, with electron energy loss spectroscopy (EELS) and focused ion beam (FIB) technology to address critical needs in process development and defect analysis.
www.fei.com
www.cnse.albany.edu
www.sematech.org

Nanotech Europe Moves to Berlin

Nanotech Europe 2009, an annual conference and exhibition on nanotechnology will be held in Berlin, Germany from September 28-30, 2009. The event offers a broad, interdisciplinary overview of nanotechnology, and the opportunity to meet and discuss with the field’s top scientists and international companies in the nanotechnology community. The fifth Nanotech Europe has a broad scope, covering leading-edge research, industrial applications and cross-cutting topics including electronics, photonics, materials, health and bio, instrumentation, energy as well as safety and investment. In total, 36 sessions will be held by over 180 speakers from both academia and industry.
www.nanotech.net

Brandenburger Tor, Berlin, Germany (source: pixelio.de)